Scanview

SCANVIEW

  • Its intuitive design reduces the learning curve, and so on, the time required to configure the equipment. Furthermore, it takes the maximum advantage of all functionality included in SITAU systems. For example: introducing wedge parameters, results presentation in all kind of views (A, B, C-scans) with measurement cursors of position, amplitude, attenuation and time-of-flight.

     

    Moreover, ScanVIEW includes a set of toolboxes for presenting, evaluating and sizing possible defects, save and export the captured data and create automated reports. The software also allows synchronizing acquisitions with the probe movement and position over the test material, which allows multiple stop-and-run interruptions during the inspection procedure while maintaining data integrity

     

    ScanView includes all of the advanced processing algorithms developed by DASEL, like Grain-Noise-Filter, Automatic Focusing, Data compression and Coded Excitation.
  • • Advanced data analysis

    • Fully customizable display

    • Wizard menu

    • Customizable and Flexible reporting

    • Off-line peak gate calibration

    • Easy wedge configuration and Auto-Focus mode

    • Metric and US customary units

    • Fast gain /range / focal point adjustment

    • Ability to open multiple files simultaneously

    • S-scan, L-scan, F-scan C-scan Display tool

    • Off-line A-scan synchronization

   

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